Sophisticated Research Facilities

300 kV Aberration Corrected HRTEM with STEM, EDXS, and EELS

300 kV Double Aberration corrected (both image and probe corrected) Atomic Resolution Transmission Electron Microscope

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Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS)

Time-of-flight secondary ion mass spectrometer can be used to obtain compositional information (mass spectra and 2D elemental distribution maps) of the surface within a depth of 5 nm as well as 3D elemental distribution profiles and maps along the depth ranging from 5 nm to 300 nm by depth profiling using in-situ argon ion sputtering.

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Vacuum and Inert Gas Universal Testing Machine

A versatile universal testing machine (model Kappa 50 SS-CF, manufacturer: M/s ZwickRoell Testing Systems GmbH, Austria) capable of carrying out a variety of mechanical tests (tension, compression, 3-point bend, tensile and compressive creep, creep crack growth, stress rupture, stress and strain controlled fatigue, creep-fatigue interaction at both ambient and elevated temperatures up to 1500 oC in air, vacuum or inert atmosphere. The types of materials which can be tested include metals and alloys, ceramics, polymers, composites and functionally graded materials.

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